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Microbial Contamination Monitoring and cleanroom data management
Contamination Control Strategies for Innovation and Regulatory Compliance FAQ

Particle Measuring Systems (PMS) recently hosted a webinar titled Contamination Control Strategies for Innovation and Regulatory Compliance to explain how the implementation of a CCS attempts to address the varied causes of contamination and compromised sterility. This easy to read compendium for quick consultation consists of questions received in conjunction with the webinar along with questions from years of supporting our customers in their compliance journey. Questions are answered below by Ugo Omeronye .

airborne nanoparticle detection
Airborne Nanoparticle Detection in Semiconductor Tools

The increasing attention on driving better product yield performance with advanced technology nodes has drawn reasonable discussion for in-tool monitoring to reduce nanoparticles that can have an impact on yield. With that in mind, Particle Measuring Systems (PMS) launched the new NanoAir™ 10 Condensation Particle Counter that measures particles down to 10 nm and the ParticleSeeker™ Smart Manifold system which is the first-ever manifold designed to handle nanoparticle transport. This product will unlock a new world of monitoring possibilities, providing a look into a current blind spot of the requirements and needs in the industry.

Why is 50% the Limit for Particle Counting Efficiency Sizing Thresholds?

Particle counting efficiency is crucial in particle measurement, especially when using optical particle counters. This term denotes the likelihood of precisely detecting and enumerating particles within a specified size spectrum. In this context, the term “counting efficiency” represents the ability of the particle counter to quantify particles of a given size accurately. It measures the instrument’s performance, indicating how effectively it can detect and count particles of various sizes.

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