Semiconductor & Microelectronics

Contamination Monitoring Solutions

Particle Measuring Systems has the application expertise and industry-leading sensitivity particle monitoring instruments you need to control contamination to reduce yield loss.

We provide the global expertise and high-performance laser particle counters you count on. We continuously count particles when and where products are at risk to determine how clean your semiconductor/microelectronics processes really are.

Industry Leading Sensitivity

Particle Measuring Systems is the only company to reliably provide you with the highest particle counting sensitivity for chemicals, water, airborne, compressed gas, and molecular applications.

Point of Use Contamination Monitoring
to Protect Your Product

You need your product protected where it is and when the contamination occurs. Our solutions include:

  • Continuous real-time contamination monitoring for actionable data
  • Sensitivity-leading metrology solutions
  • Measure contamination when and where products are at risk
  • Improve throughput and quality

Direct in Every Major Market

Particle Measuring Systems has direct sales and service support in every major market, as well as a global team of Application Engineers positioned in every region with a wide range of expertise to support your needs including training and technical support.

We understand that your system is unique and that your contamination monitoring needs are specialized. Our team is there to make sure you have the support you need.

Our PMS Service Team provides you with the repeatable service, repair and reliable calibration that you need to protect your product from contamination.

Ultrapure Water UPW Contamination Control / 20 nm Particle Counting

Presented by Glen Slayter, Intel, and Dan Rodier, Particle Measuring Systems at the 2020 Ultrapure Micro event. Watch this case study on the benefits of and monitoring of particles in ultrapure water (UPW) as small as 20 nm. Learn more about the Ultra DI 20 Plus particle counter.

Only Particle Measuring Systems has proven and reliable 20 nm particle counting solutions for water and chemicals.

Contamination Control Products

NanoAir™ 10 Aerosol Particle Counter

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20 nm Liquid Particle Counter: Ultra DI® 20 Plus

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20 nm Chemical Particle Counter: Chem 20™

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0.1 Micron Particle Counter: Lasair® III 110

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AMC Monitoring: AirSentry® II Point-of-Use Ion Mobility Spectrometer

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Deionized Water Particle Counter: HSLIS-M50e

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Liquid Particle Counter: LiQuilaz® II Series

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Or, let us help you find a solution for your contamination monitoring:

Explore all the ways PMS leads the industry in particle counting sensitivity.

Still have Questions?

Our customer support is ready to answer your questions or get a quote ready for you.

Industry Leading Sensitivity Request a Quote