chemical to 40 nm
Chemical Particle Counter: UltraChem® 40
Precision Particle Monitoring for Advanced Chemical Processes. Sensitivity range: 40 – 125 nm
Product Details
UltraChem® 40 is a high-sensitivity liquid particle counter designed for advanced chemical monitoring, capable of detecting particles as small as 40 nm using NanoVision® technology to reduce scatter and improve accuracy. It offers broad chemical compatibility, low maintenance, and versatile integration for contamination control in semiconductor and cleanroom processes.
- Eliminates interference from molecular scatter, enabling precise particle sizing even in high-scatter chemicals.
- Reduces background noise and false counts, so only true particle fingerprints are recorded.
- Allows users to visualize what the particle counter sees, improving confidence in contamination control.
Resources
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SPEC SHEET: UltraChem 40
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Particle Sensor Mobile Cart for UltraChem® 40P
- UltraChem® 40 Particle Counter Manual
- Why Particle Monitoring in Process Chemicals Is Non-Negotiable
- Particle Counting in Process ChemicalsEffervescent and Hot Chemicals
- Particle Contamination in Chemical Distribution Systems
- Uncovering Chemical Quality Improvements Through a Holistic Approach to Chemical Quality Management
- Precision at the Source: Particle Control for Semiconductor Chemical Suppliers
- 20 nm Chemical Batch Sampling Solution
Accessories
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