Redefining Cleanroom & Minienvironment Control with Nanoparticle Monitoring

Benton is a Product Line Manager at Particle Measuring Systems, focused on aerosol, compressed gas, and airborne molecular contamination (AMC) monitoring in cleanrooms. With a background in chemical engineering and hands-on experience in the semiconductor and microelectronics industries, he helps manufacturers improve contamination control. Benton is an expert in detecting and reducing AMC and particle levels in critical environments, supporting high-yield production and cleanroom compliance. He has delivered technical training and presentations on cleanroom contamination topics around the world. Benton holds both a Bachelor’s and a Master’s degree in Chemical Engineering. At Particle Measuring Systems, he supports global innovation in cleanroom monitoring.

Lexi Lake, M.S., is an Applications Engineer at Particle Measuring Systems with expertise in aerosol, gas, and airborne molecular contamination (AMC) monitoring for cleanroom manufacturing. She works closely with pharmaceutical, biotech, semiconductor, and microelectronics companies to improve contamination control strategies. Previously, Lexi was an Aerobiology Engineer, where she led aerosol R&D and helped develop new microbial monitoring technologies. Her scientific background includes research on airborne pathogens and respiratory disease therapies. Lexi holds a Master of Science in Microbiology and a Bachelor of Science in Biology. She regularly shares her knowledge through presentations on viable and non-viable particle monitoring, airborne particle behavior, and contamination control.