20 nm Chemical Particle Counter: Chem 20™/SM
Prevent process failures and poor device performance by being able to respond quickly to chemical changes with Particle Measuring Systems (PMS) Chem 20™ chemical particle counter line. Meet the International Roadmap for Devices and Systems (IRDS)
Available Models:
- Chem 20 – Detect particles down to 20 nm for cutting-edge chemical monitoring.
- Chem 20 SM – Engineered for use on hazardous area solvents such as IPA and PGMEA
Product Details
Increase yield and reduce defects or product recalls by preventing process contamination. The Chem 20™ line offers online and batch sample-based chemical monitoring from incoming QC to point of use. The new Chem 20 SM extends your monitoring capabilities to hazardous area solvents.
Resources
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SPEC SHEET: Chem 20 SM
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SPEC SHEET: Chem 20
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Syringe Liquid Batch Sampler: SLS-20
- OPERATIONS MANUAL: Chem 20™ Chemical Particle Counter
- Particle Counting in Process ChemicalsEffervescent and Hot Chemicals
- Why Particle Monitoring in Process Chemicals Is Non-Negotiable
- Uncovering Chemical Quality Improvements Through a Holistic Approach to Chemical Quality Management
- Component Cleanliness Testing for Liquid Systems
- Microbubbles in Liquid Particle Counting
- Particle Detection in Liquids with High Viscosity or Molecular Weight
- Refractive Index Effects on Particle Size Measurement
- Liquid Particle Counting Troubleshooting
- Precision at the Source: Particle Control for Semiconductor Chemical Suppliers
20 nm Chemical Batch Sampling Solution
Learn why 20nm sensitivity is important in particle counting and how our system makes advances in water reduction and safety in our whitepaper.
Accessories
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