On Demand | Duration: 30 mins

Data Analysis Techniques for Understanding Particle Contamination in High Purity Liquids

Continuous particle monitoring in liquid systems provides valuable, real-time data that allows us to detect and eliminate sources of particle contamination. Understanding the data generated by the particle counter plays a key role in this process. This webinar will cover a range of useful data analysis techniques that may be applied to data from liquid particle counters, starting with basic techniques such as time-plot and particle size distribution analysis, before introducing more advanced data analysis techniques such a Poisson statistical analysis, and the application of Fast Fourier Transform analysis to identify cyclical contamination events.

In this on-demand webinar you’ll learn:
1. How to identify long-term particle contamination trends and sudden contamination events using time-plots
2. How to plot particle size distributions and apply them to distinguish between regular and irregular particle measurements
3. How advanced data analysis using Poisson statistics and Fast Fourier Transform analysis can be used to identify systematic and cyclical contamination events

Webinar Presented By:
Dan Rodier, Ph.D.
Ph.D, Technology Development Manager, Electronics Division Particle Measuring Systems

Dr. Rodier has a Ph.D. in analytical chemistry from the University of Colorado and has over 25 years of experience and many patents developing and implementing technologies and strategies to measure airborne molecular species and particulate contamination. He has worked with customers across Asia, Europe, and North America to implement monitoring programs in the semiconductor, disk drive, and display industries.