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On Demand | Duration: 1h

Banner with background image of man examining wafer and text promoting webinar "Introduction to Particle Contamination Monitoring in the Semiconductor Fab Environment" now available on demand

Particle Measuring Systems has been a leader in particle counting technology for the semiconductor industry for over 50 years, holding foundational patents in optical light scattering for particle detection. This webinar is designed to provide a comprehensive overview of particle counters, their operation, and their critical applications within modern semiconductor fabs. Ideal for new employees in the semiconductor industry, or those looking to refresh their particle counting knowledge.

Particle contamination is a leading cause of yield loss and quality issues, making particle counters essential for maintaining high productivity and minimizing defects. This presentation will explore the fundamentals of particle counters, their working principles, and their deployment in key applications such as aerosol sampling, cleanroom monitoring, liquid chemical analysis, and ultrapure water (UPW) monitoring.

What you'll learn:
  • Master the Fundamentals of Particle Counting
  • Discover Critical Applications in Semiconductor Manufacturing
  • Learn How to Minimize Yield Loss and Enhance Product Quality

 

Who should attend:
  • Process Engineer
  • Quality Assurance Engineer
  • Cleanroom Technician
  • Semiconductor Manufacturing Engineer
  • Yield Enhancement Engineer
  • Contamination Control Specialist
  • Materials Scientist
  • Facilities Engineer
  • Equipment Maintenance Engineer
  • Quality Control Analyst
  • Environmental Health and Safety (EHS) Manager
  • Operations Manager
  • Chemical Process Engineer
  • Equipment Validation Specialist
  • Production Supervisor
  • Reliability Engineer
  • Research and Development (R&D) Scientist
  • Field Application Engineer
  • Product Development Engineer
  • Supplier Quality Engineer
Webinar Presented By:
Benton Hutchinson
Product Line Manager

Benton is a Product Line Manager in the Electronics Division, covering the aerosol, compressed gas, and airborne molecular contamination (AMC) products at Particle Measuring Systems. Before that, Benton was an Applications Engineer focusing on the AMC and aerosol products globally. He serves as a subject matter expert for both AMC and aerosol particles, specializing in their handling and mitigation in cleanroom environments. Benton holds a Bachelors and Masters degree in Chemical Engineering.

Richard Duskey
Product Line Manager

Richard is currently a Software and Systems Product Line Manager in the Electronics Division with Particle Measuring Systems. Rick transitioned from his technical role in the military 8 years ago to a Service Technician position at PMS, working on a wide array of products. He has worn many hats at PMS and successfully covered positions in Service, Technical Support, Sales support,  Metrology, Life Science and Electronics Product Management. In 2019, Rick joined PMS’s team of experts presenting Particle College educational courses.

Amit Nag
Product Line Manager

Amit Nag is the product line manager for Liquid Particle Counters in the Electronics Division. He has over 20 years of experience with multiple companies, developing and launching new products, managing existing product life cycle, and training customers and employees on product technology and applications. His diverse industry experience includes the semiconductor, pharma, medical devices, and oil and energy industries.

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