airborne nanoparticle detection
Airborne Nanoparticle Detection in Semiconductor Tools

The increasing attention on driving better product yield performance with advanced technology nodes has drawn reasonable discussion for in-tool monitoring to reduce nanoparticles that can have an impact on yield. With that in mind, Particle Measuring Systems (PMS) launched the new NanoAir™ 10 Condensation Particle Counter that measures particles down to 10 nm and the ParticleSeeker™ Smart Manifold system which is the first-ever manifold designed to handle nanoparticle transport. This product will unlock a new world of monitoring possibilities, providing a look into a current blind spot of the requirements and needs in the industry.

Particle Contamination in High-Purity Process Chemicals
ISO 14644 TR 21
2023 Technical Report TR 21

The Technical Committee (ISO/TC209) responsible for ISO 14644, the set of Standards governing cleanrooms and associated controlled environments, looked at the need for a new document to aid users in the application of airborne particle counters; especially considering the new revision to EU Annex 1 – Manufacture of Sterile Medicinal Products (2022). The Technical Report (TR 21) describes the application of particle counters for classification and monitoring to provide sufficient proof that the cleanroom performance both meets the required standard and is demonstrated to be maintained within ‘normal’ operating conditions. Learn more…

Microbial Contamination Monitoring and cleanroom data management
Counting Efficiency and Comparison of Particle Counters

Some users believe it is necessary to divide the particle counts of non-volumetric particle counters by the counting efficiency (CE) at the lower limit to establish the “true” concentration of particles in the fluid system. Other users do not understand why two, similar-sized channels of particle counters with different limits of detection do not report the same value. This paper will discuss the science behind these differences and alleviate concerns that come from the characteristics of non-volumetric particle counters.