Particle Contamination in Chemical Distribution Systems

Electronics and Semiconductor

Particle Physics

Get introduced to cleanroom basics, including a review and comparison of ISO and FS209E classifications. Review particle size, composition, types and sources, and discuss commonly used measurements to define the size of irregularly shaped particles and the implication of each technique. Additionally, you will explore particle concentrations in liquid and air samples.

Particle Mechanics

Understand particle behavior by reviewing transport characteristics, interactions and various forces on particles. Get an introduction to filtration mechanisms and filter efficiency curves for air and liquid systems, and learn about the role played by the refractive index, particle size and shape. In addition, the principles of Rayleigh and Mie light scattering will be covered, including basic scattering relationships.

Fundamentals of Optical Particle Counters

This presentation introduces the fundamentals of optical particle counters (OPCs). Topics include OPC design and specifications, industry nomenclature, laser light and detector basics, instrument types and a discussion on sensor resolution and accuracy. The objective of the presentation is to establish a common background and language that will contribute to a better functional understanding of optical particle counters.

Monitoring Particles in Air

Get an introduction to the types of particle counters used to monitor aerosol particles. A comparison between mobile, fixed and sequential monitoring, along with the advantages and disadvantages of each method, will be covered. Additionally, specialized applications and possible types of devices to monitor those applications will be discussed. Equipment includes particle counters, spectrometers, monitors and sensors.

Introduction to Particle Monitoring in Liquids

Discuss the pros and cons of different types of liquid particle counting systems, and use real data to get a better understanding of calibration accuracy in these high-performance products.

Advanced Liquid Particle Counting

Delve into advanced topics of liquid particle counting, including what happens to particle sizing when the refractive index changes in the fluid, particle or both. Also, learn what constitutes statistical significance, and see what can be done to improve data quality. In the remaining time, we’ll address your specific liquid application questions and search for possible solutions.

Molecular Contamination Monitoring

Learn about common molecular contamination problems and how to resolve them with an overview of molecular contamination, its sources and effects, and how it interacts with different materials.

Particle Transport and Sampling

Different aerosol particle sampling methods utilize a length of tubing to transport samples to a particle counter. Learn how tubing affects particle counts, and see the effect short tubing length has on particle transport losses.

Advanced Light Scattering

Take an in-depth look at Mie, Rayleigh and other theories of light scattering, and discuss the origins of the equations and how they were derived. Additionally, take a closer look at the influence particle size, refractive index and shape have on scattering intensity.

Data analysis

Monitoring particles provides real time actionable data.  This session presents several ways to analyze the data to further increase its value.

Nanoparticle Measurement

Learn about nanoparticle sources and impacts, behavior of nanoparticles in clean environments and technologies for measuring nanoparticles, including condensation particle counters, electrometers and scanning mobility particle sizers.

Cleanroom Certification and Products

Did you know that the particle counter you use could impact the certification process? This course discusses the differences between cleanroom certification and monitoring and what is required to perform a cleanroom certification, including an overview of ISO 14644-1 and 14644-2.

Surface Contamination

Learn methods and techniques for parts cleanliness testing for the semiconductor, hard disk, automotive, and pharmaceutical and medical device industries, including methods of particle extraction, techniques for measuring particles, data analysis and optimizing parameters of ultrasonic extraction.