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Controlling Contamination in High-Purity Chemicals
The critical particle size for todayās leading-edge semiconductor technology is shrinking. Now in the sub-10 nm size-range, the control and mitigation of potentially yield-impacting particles is growing more important.Ā Here, we’ll discuss how the Chem 20ā¢ Chemical Particle Counter’s industry-leading sensitivity can be applied to a variety of applications, including…