reliable in-line contamination monitoring

Ultra High Purity Gas Particle Counter: HPGP™ 101-C

Increase yield with the ultra-high purity gas particle counter HPGP 101-C. Ensure smooth processes with the only reliable in-line contamination monitoring for process gases at line pressure up to 150 psig. The HPGP is compatible with oxygen, hydrogen, and most non-toxic gases and can be used in many reactive gas monitoring applications.

Ticked bullet point Reduce start up and validation time

Ticked bullet point Extend uptime of tools and equipment

Ticked bullet point Increase quality with reduced contamination risks

gas particle counter HPGP for high purity gases

Product Details

gas particle counter HPGP for high purity gases
gas particle counter HPGP with PDS-A

HPGP™ 101-C Product Details

Lower risks of contamination-related downtime and improve reliability and safety with HPGP 101-C. Be confident in the process control as the counter has a sensitivity range of 0.1 – 5.0 µm.

Fast Data and Validation

Prevent yield loss by identifying contaminants quickly before they impact products. And reduce time needed to startup and validate processes or systems.

Broad Applications

Ensure process control in a range of applications with data that reflects real process conditions, even in high-pressure processes. The HPGP 101-C can monitor gases up to 150 psig. Plus, you can reduce equipment needs for different applications within your process as this counter works with oxygen, hydrogen and most non-toxic gases. It can also be used in reactive gas applications where other technologies might not be suitable.

Sensitivity Range 0.1-5.0 µm

Increase yield and reduce contamination risk with the the detection range of 0.1-5.0 µm.

Collect and Report Data

Ensure compliance and easily analyze data with pairing the HPGP 101-C with our Particle Data System.

Lab technician performing precise liquid handling in a controlled cleanroom environment.
reliable in-line contamination monitoring

Sampling High-Pressure Gases

Learn the fundamental relationships between air or gas volume, pressure, and flow, and how these relationships affect particle counting.

Accessories

Particle Data System (PDS-E)

Particle Data System (PDS-E)

Rack Mount (PDS-E)

Rack Mount (PDS-E)

FacilityNet Monitoring Software

FacilityNet™ Software

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