As your contamination monitoring needs increase, it’s important to continuously monitor when and where your products are at risk. Particle Measuring Systems has the application expertise to solve even your most complex contamination and defect monitoring challenges.
Get the high-performance products you need to reduce yield loss:
- Ultra DI® 20 Liquid Particle Counter
For continuous particle counting as small as 20 nm
- Nano-ID® NPC10 NanoParticle Counter
For a low zero count and high flow rate
- Lasair® III 110 Aerosol Particle Counter
For a low zero count and mobile applications
- AirSentry® II Real-time AMC Monitoring System
For continuous coverage of multiple points
- Syringe Liquid Sampler 1040
For precise, small-volume sampling
We lead the industry in sensitivity and performance.
Stop by Booth #1122 to learn more, and for your chance to win an iPad Air 2!