Particle Measuring Systems at SEMICON West 2018

Particle Measuring Systems at SEMICON West 2018


Particle Measuring Systems (PMS) attended SEMICON West in San Francisco, CA last week from July 10 -12. Throughout the event we had many visitors from various semiconductor companies, some looking for advice on specific applications, and others coming to learn more about the different instruments that PMS has to offer for cleanroom monitoring. Many of the booth visitors were from the US, but there were also visitors from the APAC region.

PMS showcased several different instruments during the event. The featured instruments included the Chem 20 chemical particle counter, the world’s most sensitive particle sensor for high purity process chemicals; the Ultra DI 20 liquid particle counter, designed for advanced process control; the Lasair III 110, which provides real-time measurement of yield-impacting particles; the Nano-ID NPC10, which boasts 10 nm sensitivity with a high sample flow rate and the lowest zero count specification on the market; and the SLS syringe liquid particle sampler, which is ideal for applications requiring precise, small-volume particle sampling.

PMS will be at the remaining 2018 SEMICON shows including Taiwan, Europa, and Japan. Come find us at these events to learn how you can benefit from our complete monitoring solutions.

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