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Webinar

Monitoring Guidelines for the Control of Particle Contamination in High-Purity Process Chemicals – March 4

 

The critical dimension of today’s advanced semiconductors continues to trend to smaller sizes.
Killer particles have been shown to come from many sources at these small geometries. It is no longer enough to rely on the Certificates of Analysis (CoA) from high-purity material manufacturers, and in particular, for bulk and specialty chemical suppliers. Continuous particle monitoring of these chemicals at all stages of the process are required to maintain the ultra-cleanliness that is required for control.

Attend to Learn:

  • Effects of transportation on chemical cleanliness
  • Protection of the manufacturing process through filtration
  • Time to usability for new liquid filters
  • Effects of liquid filter aging on the process
  • Options for Point-of-Use (PoU) process tool chemical particle monitoring

Registration

To meet the needs of our global audience, we are offering this webinar at two different times. Below are the available options along with some corresponding time examples; choose the best time for you. Note: to receive a post event recorded version, register for either event; all registrants will receive a recording.  

Option 1: Ideal for APAC/EMEA
Examples of times are: 1:00 PM Germany/France; 9:00 PM Korea, 8 PM Shanghai,

 

 

Option 2: Ideal for AMER/EMEA
Examples of times are: 2:00 pm New York, 11:00 am California, 1:00 PM Dallas, 8:00 PM Germany / France

PRESENTERS

  • Presenter

    Dwight Beal

    Global Product Line Manager Liquids

    Dwight Beal’s experience exceeds 35 years working directly with industry professionals, scientists, and engineers to provide reduced sampling variation using particle contamination monitoring for liquid applications. He understands the challenges customers experience and is well-known in the industry for providing the best contamination monitoring and data management solutions.

  • Presenter

    David Green

    Applications Engineer

    David Green has an extensive background in particle physics with over 12 years of experience working in the field of particle metrology. He is based in our office in Germany.

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Particle Measuring Systems- DK

Particle Measuring Systems Nordic
Korskildelund 4-6
2670 Greve, Denmark

T. +45 7070 2855
[email protected]

Keep in touch! Receive industry news from us:

Products

  • Aerosol Particle Counters
  • Liquid Particle Counters
  • Microbial Samplers
  • BioCapt®Certificates of Analysis
  • Compressed Gases Particle Counters
  • Molecular Monitors
  • Software / Data Management

Industries

  • Pharma
  • Semi
  • Photonics & Optics
  • Aerospace
  • Industrial Manufacturing

Applications

  • ISO 21501-4
  • Parts Cleanliness Testing
  • Annex 1 Latest Draft Revision Updates

Service & Support

  • Advisory Service
  • Product Calibration and Service
  • Customer Service

Education and Training

  • Knowledge Center
  • Software / Data Management
  • Contamination Monitoring Blog

About Us

  • Contact Us
  • Why PMS
  • Executives
  • Particle Measuring Systems’ Careers
  • Corporate Responsibility
  • COBE
  • Parent Company
  • Press Releases
  • Credibility & Registrations
  • Trademarks & Patents

Particle Measuring Systems- DK

Particle Measuring Systems Nordic
Korskildelund 4-6
2670 Greve, Denmark

T. +45 7070 2855
[email protected]

Keep in touch! Receive industry news from us:

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