David Green, Application Engineer at Particle Measuring Systems, presented a poster on “Advanced Data Analysis Strategies for Understanding Particle Contamination in Chemical Distribution Systems“ at the recent UCPPS show. The poster demonstrated how, through the application of advanced data analysis techniques, data from optical particle counters can be used to identify and characterize non-random and systematic particle contamination sources in liquid distribution systems, helping to improve overall yield. Causes of non-random and systematic particle contamination can include pumps, valves, and variations in chemical demand from tools. The analysis techniques can then also be used to verify the effectiveness of efforts made to address these contamination sources.
“It was great to share our expertise about how data analysis techniques can be applied to particle counting data to isolate systematic contamination sources in their chemical distribution systems to help improve yield”, said Green.
For more information on this topic, download the paper Advanced Data Analysis Strategies for Understanding Particle Contamination in Chemical Distribution Systems.