January 29, 2018 03:00:00 PM

Using the Taguchi Method to Determine Optimal Process Settings

Written by Katie Sternberg

The ability to measure the cleanliness of objects of various shapes and materials is important in maintaining a comprehensive contamination control program. This allows a Contamination Control Engineer (CCE) to qualify the effectiveness of different cleaning methods. This can include in-house cleaning lines and comparing parts purchased from various vendors to make direct cleanliness comparisons of different commodity items (gloves, wipes, etc.).

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January 8, 2018 03:00:00 PM

Optimized Molecular Contamination Monitoring for Lithography

Written by Noelle Demo

A dedicated, point-of-use monitor offers the following advantages over a conventional multipoint sampling system: continuous monitoring, no missed contamination events, sample tubing lengths reduced from 20 - 30 meters to 2 - 3 meters, and 5 - 10x better sensitivity.

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November 30, 2017 03:00:00 PM

Nanoparticle Monitoring in Ultra-Clean Manufacturing Environments

Written by Noelle Demo

With its 10 nm sensitivity, the NPC10 NanoParticle Counter bridges the gap between conventional aerosol optical particle counting at 0.1 µm (100 nm) and sub-nm scale airborne molecular contamination.

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November 27, 2017 03:00:00 PM

Monitoring of Ultrapure Water (UPW) Systems Using the Ultra DI 20

Written by Noelle Demo

The Ultra DI® 20 was specifically developed to meet the challenges of microelectronics UPW cleanliness monitoring.

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November 22, 2017 03:00:00 PM

Particle Counters and PoE Series

Written by Noelle Demo

Connecting instruments and electronics to power outlets can be challenging—especially in remote locations where an outlet is not easily reached. A technology that is quickly expanding is Power over Ethernet (PoE) because it provides power and network communications through a standard network cable. This application note discusses PoE technology and the applications.

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November 21, 2017 03:00:00 PM

Particle Counters and PoE Series

Written by Noelle Demo

Connecting instruments and electronics to power outlets can be challenging—especially in remote locations where an outlet is not easily reached. A technology that is quickly expanding is Power over Ethernet (PoE) because it provides power and network communications through a standard network cable. This application note discusses PoE technology and the applications.

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November 20, 2017 03:00:00 PM

Particle Counters and PoE Series

Written by Noelle Demo

Connecting instruments and electronics to power outlets can be challenging—especially in remote locations where an outlet is not easily reached. A technology that is quickly expanding is Power over Ethernet (PoE) because it provides power and network communications through a standard network cable. This application note discusses PoE technology and the applications.

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November 16, 2017 03:00:00 PM

Series: Comparing Particle Loss in Transport Tubing for Instruments with Different Flow Rates

Written by Noelle Demo

In this series, a particle counter's ideal flow rate is examined through the lens of particle loss in connecting tubing. The mathematical basis for particle loss causation is discussed and applied to the results of testing a 100 LPM device for 0.5 um and 5.0 um particle losses within 2 m tubing.

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November 15, 2017 03:00:00 PM

Series: Comparing Particle Loss in Transport Tubing for Instruments with Different Flow Rates

Written by Noelle Demo

In this series, a particle counter's ideal flow rate is examined through the lens of particle loss in connecting tubing. The mathematical basis for particle loss causation is discussed and applied to the results of testing a 100 LPM device for 0.5 um and 5.0 um particle losses within 2 m tubing.

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November 14, 2017 03:00:00 PM

Series: Comparing Particle Loss in Transport Tubing for Instruments with Different Flow Rates

Written by Noelle Demo

In this series, a particle counter's ideal flow rate is examined through the lens of particle loss in connecting tubing. The mathematical basis for particle loss causation is discussed and applied to the results of testing a 100 LPM device for 0.5 um and 5.0 um particle losses within 2 m tubing.

Read more