Semicon West

Improve your yield protection by leveraging our complete contamination monitoring solutions. Particle Measuring Systems will be at Semicon West on July 10-12, booth 410 to discuss and address your yield and monitoring challenges with several of the industry's leading contamination monitoring experts. This is your chance to learn more about the different instruments used to monitor contamination across many mediums & get expertise in application support, training, and the services you need to succeed.

Register here for a discounted Semicon West ticket

 

Application Notes

NanoVision Technology® Enables High Molecule Scatter

Semiconductor manufacturing utilizes ultra-pure chemistries which frequently have significant molecular scatter.

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Airborne Particle Measurements: 100 LPM vs. 1 CFM

Many current standards define airborne particle monitoring in units of particles-per-cubic-meter (particles/m3).

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Optimized Molecular Contamination Monitoring for Lithography

A new approach to monitoring molecular contamination in lithography is presented. Recent technical advances have made it feasible to perform continuous real-time monitoring with significant advances in sensitivity and stability while minimizing sample tubing effects. These improvements are realized by using a small, low-cost monitor that is dedicated to monitoring a single location.

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Mobile Monitoring System Speeds Detection, Localization and Troubleshooting of Molecular Contamination Sources

Decreasing the time to detect, contain and mitigate very low levels of Airborne Molecular Contamination (AMC) is becoming more critical for high tech manufacturers,

 

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Related Products

Chem 20™ Chemical Particle Counter

Chem 20™ Chemical Particle Counter

World’s first 20 nm chemical particle counter, detects larger concentrations of particles with better statistics than competitive products.

Nano-ID® NPC10 Aerosol Particle Counter

Nano-ID® NPC10 Aerosol Particle Counter

Provides meaningful data fast within unltra-clean environments by capaturing even the smallest ultrafine and nanoparticles. 

Lasair® III 110 Airborne Particle Counter

Lasair® III 110 Airborne Particle Counter

A true 0.10 μm particle counter, providing real-time measurement of yield-impacting particles with three configurations.

Syringe Liquid Particle Sampler

Syringe Liquid Particle Sampler

Uses a precision syringe and simple flow-path for delivering chemical samples from a sample vessel or chemical container, directly to the particle sensor

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AirSentry® II Mobile Airborne Molecular Contamination Detection System

AirSentry® II Mobile Airborne Molecular Contamination Detection System

Designed to enhance fixed Airborne Molecular Contamination (AMC) monitoring programs, the AirSentry II Mobile AMC Detection System is the first truly mobile system for monitoring airborne molecular contamination in cleanrooms. Mobility plays an important part in a strategic airborne molecular contamination monitoring program, allowing contamination sources to be quickly located, quantified and eliminated.