Dr. Dan Rodier, Ph.D., Staff Scientist at Particle Measuring Systems (PMS) spoke at SMC Korea 2019, hosted by SEMI on May 16, 2019. His topic, Advanced Metrology for Measuring Contamination and Managing Risk in Semiconductor Manufacturing, was well received.
In his talk, Dr. Rodier outlined data analysis techniques for assessing contamination in distribution systems, nanoparticle contamination monitoring methods, and particle control levels of advanced distribution and filtration systems. Learn more about what we do here at PMS by navigating to our Knowledge Center.
SMC Korea 2019 is a premier conference for staying informed with the latest developments of the semiconductor manufacturing industry. Particle Measuring Systems will also be at the following shows:
- Space Tech Expo USA, this week, Booth #6004
- Ultrapure Micro 2019, June 5
- SEMICON West 2019, July 9 – 11
- SEMICON Europa 2019, November 12 – 15
- SEMICON Korea 2020, February 5 – 7
Dan Rodier, Ph.D., is Staff Scientist in the Electronics Division at Particle Measuring Systems. He has a Ph.D. in analytical chemistry from the University of Colorado and has over 25 years of experience developing and implementing technologies and strategies to measure airborne molecular species and particulate contamination. Dr. Rodier has played a key role in using state of the art nanoparticle contamination monitoring and advanced data analysis techniques to reduce risk in semiconductor manufacturing.
