“Improve yield and quality by monitoring particle contamination during optics manufacturing” by our own Global Applications Engineering Manager, John Davis was recently published in the December edition of Laser Focus World. This paper discusses contamination monitoring solutions for the optics industry.
Particle monitoring enables data-driven decisions to meet increasing yield and device performance levels required as smaller optical device structures, shorter wavelengths, and higher laser power densities are employed.
To access this paper, click here.
