Complete Yield Protection Contamination Monitoring Solutions – Join us at Semicon West next week!

Complete Yield Protection Contamination Monitoring Solutions – Join us at Semicon West next week!

Blog

Semicon-2018.jpg

Particle Measuring Systems will be attending Semicon West in San Francisco, CA from July 10-12, 2018. Learn about how to improve your yield protection by leveraging our complete contamination monitoring solutions. Industry experts will be available at booth 410 to discuss and address your yield and monitoring challenges.

Learn more about the different instruments used to monitor contamination across many mediums & get expertise in application support, training, and the services you need to succeed. Many of these industry-leading instruments will be available to see and learn more about during the event. Stop by our booth to watch short presentations or talk with our experts about how these particle counters and molecular contamination monitors could work for your specific needs. Below are the instruments that PMS will have at Semicon West this year.

We look forward to seeing you at Semicon West! Register here for a discounted ticket.

Leave a Reply

Your email address will not be published. Required fields are marked *

Explore Other Topics

Search Knowledge Center: