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Webinar: 20 nm Contamination Control

for Chemical Batch Sampling

20 nm Batch Sampling of Process Chemicals

Particle size specification for process chemicals is a critical quality control for the semiconductor industry. Leading-edge microelectronics manufacturers require very clean process chemicals that are rigorously monitored for contamination and filtered to a particle size of 20 nm or below.

Attend this webinar to learn about the world’s only 20 nm chemical contamination monitoring solution, the Chem 20 particle counter from Particle Measuring Systems, and how it combines with the SLS 20 sampler for a complete batch sampling solution. Topics covered include:

  • Product features
    • Overcoming Background Scatter
    • Laser Safety
    • Sensing Bubbles in Sample Flow
    • Handling a Reduction in Sample Flow
    • Leak Detection
    • Obtaining Stable and Repeatable Data
  • Pre-Sampling Processes
    • Container Cleaning
    • Flushing
  • Sample Waste
  • Switching Chemicals
  • Use Cases of Different Chemicals

 

Complete the form to access this webinar anytime. 

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Particle Measuring Systems EN-CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

Products

  • Aerosol Particle Counters
  • Liquid Particle Counters
  • Microbial Samplers
  • Molecular Monitors
  • BioCapt® Certificate of Analysis (CofA)
  • Software / Data Management

Industries

  • Pharma
  • Semi
  • Contamination Monitoring Solutions for the Photonics & Optics Industry
  • Aerospace
  • Particle Measurement for Industrial Manufacturing

Applications

  • ISO 21501-4
  • USP 788
  • Parts Cleanliness Testing

Service & Support

Education and Training

  • PMS™ Knowledge Center

About Us

  • COBE
  • Contact Particle Measuring Systems

Particle Measuring Systems- EN/CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

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