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Improve yield and quality by monitoring particle contamination during optics manufacturing

Improve yield and quality by monitoring particle contamination during optics manufacturing

Similar to the way the semiconductor industry has evolved over the past few decades--with wafer processing being performed in ever-cleaner conditions--advanced optics manufacturing is now requiring much cleaner processing environments than were necessary in the past. 

Learn about particle contamination monitoring solutions for the optics industry.

Interested in learning more? Complete the form on the right side of this page to receive a free copy of Improve yield and quality by monitoring particle contamination during optics manufacturing by our own Global Applications Engineering Manager, John Davis. 

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Particle Measuring Systems EN-CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

Products

  • Aerosol Particle Counters
  • Liquid Particle Counters
  • Microbial Samplers
  • Molecular Monitors
  • BioCapt®Certificates of Analysis
  • Software / Data Management

Industries

  • Pharma
  • Semi
  • Contamination Monitoring Solutions for the Photonics & Optics Industry
  • Aerospace
  • Particle Measurement for Industrial Manufacturing

Applications

  • ISO 21501-4
  • USP 788
  • Parts Cleanliness Testing

Service & Support

Education and Training

  • Knowledge Center

About Us

  • COBE
  • Contact Particle Measuring Systems

Particle Measuring Systems- EN/CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

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