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Application Note

Cleanliness Verification

Each year the need for stricter cleanliness levels for cleaned parts is discovered. One professional may work in the semiconductor industry, where critical dimensions are shrinking every hour, or so it seems. Another professional may work in the automotive industry, where it is being learned that the initial operation of an engine will determine its life expectancy.

In all cases, the tolerable level of contamination is constantly decreasing. The problem is, how to measure this contamination? With the exception of the semiconductor wafer, most contamination sensitive parts are complex in shape and therefore do not lend themselves to traditional scanning techniques; therefore, different methods need to be used when testing these items. Let’s take a look at the three more common techniques currently used and discuss the advantages, disadvantages and benefits of each.

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Particle Measuring Systems EN-CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

Products

  • Aerosol Particle Counters
  • Liquid Particle Counters
  • Microbial Samplers
  • Molecular Monitors
  • BioCapt®Certificates of Analysis
  • Software / Data Management

Industries

  • Pharma
  • Semi
  • Contamination Monitoring Solutions for the Photonics & Optics Industry
  • Aerospace
  • Particle Measurement for Industrial Manufacturing

Applications

  • ISO 21501-4
  • USP 788
  • Parts Cleanliness Testing

Service & Support

Education and Training

  • Knowledge Center

About Us

  • COBE
  • Contact Particle Measuring Systems

Particle Measuring Systems- EN/CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

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