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Application Note

Ensuring AMC Airborne Molecular Contamination Control in Clean Manufacturing Environments

In clean manufacturing environments, two aspects of AMC Airborne Molecular Contamination need to be understood: (1) the background levels of contamination existing under stable conditions, and (2) the elevated concentrations that occur during contamination events.

airborne molecular contamination monitoring per day AMCA new approach to monitoring both aspects of molecular contamination is presented. Recent technical advances have made it feasible to perform continuous, real-time monitoring of critical locations in clean manufacturing environments with significant advances in sensitivity and stability. These improvements are realized by using a small, low-cost monitor that is dedicated to continuously monitoring a single, critical location.

Additionally, a distinction needs to be made between critical and non-critical environments. Critical locations are those where either processes or products are directly at risk for damage from molecular contamination or where a known potential contamination source exists. Non-critical contamination areas are typically cleanroom environmental monitoring and return air monitoring. Contamination levels in these areas do not have as direct of an impact on products and processes, but are indicative of general cleanliness. Optimal monitoring solutions for critical and non-critical locations need to be implemented as part of a complete facility monitoring system.

COMPLETE THE FORM TO ACCESS THE FULL PAPER

Are you looking for an AMC Monitoring solution? Particle Measuring Systems has a complete line of AirSentry II AMC Monitors for:

  • Mobile AMC Monitoring 
  • Multi-point AMC Monitoring 
  • Point of use AMC Monitoring 

Contact us today to learn more.

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9630 Wattwil, Switzerland

T: +41 79 261 67 41
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Keep in touch! Receive industry news from us:

Products

  • Aerosol Particle Counters
  • Liquid Particle Counters
  • Microbial Samplers
  • Molecular Monitors
  • BioCapt®Certificates of Analysis
  • Software / Data Management

Industries

  • Pharma
  • Semi
  • Contamination Monitoring Solutions for the Photonics & Optics Industry
  • Aerospace
  • Particle Measurement for Industrial Manufacturing

Applications

  • ISO 21501-4
  • USP 788
  • Parts Cleanliness Testing

Service & Support

Education and Training

  • Knowledge Center

About Us

  • COBE
  • Contact Particle Measuring Systems

Particle Measuring Systems- EN/CH

Reinluftweg 1
9630 Wattwil, Switzerland

T: +41 79 261 67 41
E: [email protected]

Keep in touch! Receive industry news from us:

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