Particle Measuring Systems participated in the 2019 Pittcon Conference and Expo held in Philadelphia from March 18th through the 21st. While several companies exhibited particle sizing instruments, Particle Measuring Systems was the only exhibitor that focused on particle counters.
Particle Measuring Systems releases the Lasair III aerosol particle counter with several upgraded enhancements.
November 8, 2016, Boulder, CO – Particle Measuring Systems (PMS) has announced the release of the new Lasair III Cleanroom Particle Counter with enhancements to stay ahead of new industry requirements while also improving usability.
Global company expands coverage in Benelux with direct sales and service.
August 1, 2016, Boulder, CO – Effective August 1, 2016, Particle Measuring Systems (PMS) has sales and service offices in France and Benelux, providing the industry with the full benefits of working directly with the manufacturer, provider, and servicer of their equipment. Our dedicated sales team can answer your application questions related to particle, molecular and microbiological monitoring, sterility assurance and regulatory, as well as provide assistance specifying, installing and validating complete Facility Monitoring Systems. In addition, calibration and repair services will be provided to our customers from our fully staffed laboratory in Belgium or on-site at our customer’s facilities upon request.
As environmental system designers, we are often asked where to place sample points for particle monitoring, whether it be performed in a pharmaceutical cleanroom or clean device (RABS, isolator, etc.). The answer is not always straightforward. There are several guidance documents that offer advice on what processes need to be monitored, along with advice on […]
Through continuous process and equipment advancements, semiconductor manufacturers are approaching 14 nm feature sizes and heading even smaller, while hard-disk drive fly heights are now less than 10 nm. This ever-reducing device feature size requires comparable cleanliness-level improvements in ultrapure water (UPW). UPW purity is especially important with its high use in direct contact with wafers as a final cleaning and rinsing agent in many production steps. Leveraging recent advances in laser optics and detector technology, UPW particle concentration ≥20 nm (≥9 nm for metallic particles) can be effectively monitored.
Dr. Gilberto Dalmaso, Global Aseptic Processes Development Manager at Particle Measuring Systems, will be presenting at the CLEAN ROOM 2016 conference in Milan. His speech, “Requirements and new solutions for air and surface monitoring in Grade A critical areas,” will focus on the new technologies to improve and optimize air and surfaces monitoring for biological contamination in cleanrooms.
Particle Measuring Systems just completed another successful MD&M show with strong results, meeting with current clients and reaching out to new businesses. Our show message was As experts in good manufacturing practice regulations (GMPs), microbiology and environmental monitoring, we help you assure sterility when and where you need it most. Supporting this statement, PMS brought a comprehensive range of microbial and particle products including the BioCapt Single Use Microbial Impactor and the MiniCapt Mobile Air Sampler. The Lasair III particle counter rounded out the contamination monitoring solutions. As a special attraction this year, PMS provided a sneak peek to the soon to be released SurCapt Microbial Surface Detection Kit (learn more next week).
Carrying on a global Semicon tradition, Particle Measuring Systems (PMS) had a notable booth presence at Semicon Korea in January. The overall theme of the booth was “Global experts in contamination monitoring solutions since 1972.” PMS had over 220 visitors from a large variety of semiconductor companies. Most of the booth visitors were from Korea, but there were also visitors from China, Taiwan, Japan, Malaysia, America, and Europe.
Particle Measuring Systems Releases the SurCapt™ Microbial Surface Detection Kit.
February 15, 2016, Boulder, CO – The newly released SurCapt™ Microbial Surface Detection Kit from Particle Measuring Systems (PMS) is an all-inclusive, ready-to-use solution which simplifies and quickens the process of environmental surface testing for biological contamination. The kit uses GreenLight® Technology for the rapid detection of microbial activity on cleanroom surfaces and the design reduces the likelihood of sample cross-contamination and mishandling by the operator.
Are your particle counters ISO 14644-1 compliant and able to be calibrated to all required tests according to ISO 21504-4?