Particle Measuring Systems (PMS) attended SEMICON West in San Francisco, CA last week from July 10 -12. Throughout the event we had many visitors from various semiconductor companies, some looking for advice on specific applications, and others coming to learn more about the different instruments that PMS has to offer for cleanroom monitoring. Many of the booth visitors were from the US, but there were also visitors from the APAC region.
Archives for July 2018
Particle Counting in Injectable Solutions
Requirements stated in USP <788>, EP 5.1 and JP 17 demand that injectable solutions are effectively monitored for microcontamination, specifically non-soluble particulates. Potential sources of particle contamination include the manufacturing environment, personnel, and packaging components. In this blog, we examine the history of particulate control in injectables and counting solutions that meet standards set by pharmacopoeias.
Complete Yield Protection Contamination Monitoring Solutions – Join us at Semicon West next week!
Particle Measuring Systems will be attending Semicon West in San Francisco, CA from July 10-12, 2018. Learn about how to improve your yield protection by leveraging our complete contamination monitoring solutions. Industry experts will be available at booth 410 to discuss and address your yield and monitoring challenges.
Particle Monitoring Requirements in Pharma Cleanrooms
Pharmaceutical manufacturers must demonstrate compliance with the regulations at every stage before a drug can be released to market. To satisfy these requirements, the products are manufactured in a controlled environment, known as a cleanroom. A cleanroom is the fundamental starting point for contamination control.
