The Nano-ID® NPC10 NanoParticle Counter is the first condensation particle counter specifically developed for ultra-clean manufacturing environments. It provides meaningful data fast with its high flow rate and 10 nm particle detection. By combining a10 nm sensitivity with a high sample flow rate, it gives the lowest zero count specification on the market. The Nano-ID NPC10 NanoParticle Counter provides single particle detection for the cleanest manufacturing and testing applications, and 2.8 LPM flow rate allows for fast and statistically valid measurements.
Archives for July 2015
Through continuous process and equipment advancements, semiconductor manufacturers are approaching 14 nm feature sizes and heading even smaller, while hard-disk drive fly heights are now less than 10 nm. This ever-reducing device feature size requires comparable cleanliness-level improvements in ultrapure water (UPW).