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Particle Measuring Systems
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News Blog

January 23, 2021 03:30 PM

Batch Sampling Down to 20 nm with the SLS-20: What’s New

Written by PMS

sls-20-chem-20-system

In this blog series, we introduce the most sensitive system for detecting contamination in microelectronic applications. Through several rigorous studies, we demonstrate the veracity and reliability of data collection for various process chemicals.

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January 13, 2021 03:00 PM

Understanding Nanoparticle Contamination in Ultrapure Water: Improvements in Monitoring through Filter Studies

Written by PMS

In this blog series, we’ll be looking at the signal pathway for a typical liquid particle counter and two case studies with the Ultra DI liquid particle counters to understand how the detection of the smallest contamination was revolutionized and recharged for counting on the nano-scale.

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January 7, 2021 12:23 AM

Airborne Particle Counter Results: Why Two Instruments Might Give Inconsistent Results

Written by PMS

Airborne Particle counter results

When particle counters work together to give data on the state of contamination control, they’re going to disagree on the numbers. But why do the counts not match? The answer encompasses model, manufacturing, engineering design, and calibration.

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December 18, 2020 06:51 PM

Ultrapure Water Nanoparticle Contamination Monitoring

Written by PMS

signal-wavelength

In this blog series, we’ll be looking at the signal pathway for a typical liquid particle counter and two case studies with the Ultra DI liquid particle counters to understand how the detection of the smallest contamination was revolutionized and recharged for counting on the nano-scale.

Read more

December 10, 2020 10:11 PM

Remote Validation and Training services during the Pandemic: A Success Story

Written by PMS

Remote Validation and training

Remote working, and allowing fewer vendors onsite can make projects very challenging, sometimes pausing projects indefinitely. David Quelle, GM of PMS Brazil, discusses one example where the Particle Measuring Systems’ team was able to work with a customer to remotely validate their FaciltyPro Environmental monitoring system & MiniCapt Monitors and conduct training.

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December 3, 2020 10:19 PM

Contamination Control Advisory Services during the Pandemic

Written by Blu Buquoy

Contamination Control Advisory Services

Interview with Frank Panofen, Life Science Marketing Manager at Particle Measuring Systems   How do we solve contamination control issues when face to face discussions and in-person visits are not an option? In this interview, Dr. Frank Panofen of Particle Measuring Systems (PMS) explains how PMS advisors tackled travel restrictions and the inability to visit customers: […]

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November 25, 2020 12:00 AM

Parts Cleanliness Testing Application Case Study

Written by Lauren Kuta

particle counter for parts cleanliness testing

When most people think about particle counting, they think mainly about testing high purity chemicals, ultra clean DI water and aerosol particulate within cleanrooms and Fabs. There is a sub sector market that deals specifically with surface parts testing of OEM products who provide finished products to the semiconductor and other industries. These parts need […]

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November 20, 2020 05:16 PM

Three Core Events to Establish Environmental Contamination Control – Per EU GMP Annex 1

Written by PMS

rabs-isolator

The 2020 release of the EU GMP Annex 1 includes a new chapter on viable and non-viable environmental and process monitoring. Trend analysis and its impact on the contamination control strategy is now an essential activity that is referenced multiple times. We discuss the changes here.

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November 17, 2020 05:57 PM

Argonaut Manufacturing and PMS, A Contamination Monitoring Success Story!

Written by PMS

When Argonaut Manufacturing was setting up their new state-of-the-art fill line they wanted the best contamination monitoring solution in a tight timeframe. Watch how Argonaut and PMS worked together to complete the mission.

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November 17, 2020 02:59 AM

20 nm Chemical Particle Counter Helps with Contamination Control

Written by John Kearns

20 nm Particle Counter by Particle Measuring Systems

In semiconductor manufacturing, due to the small size of devices, smaller particles (20 nm) can cause significant product defects and reduce yields. The Particle Measuring Systems (PMS) team recently visited some customers who were using less sensitive, previous generation particle counters. We performed onsite testing that helped them determine on which chemistries the Chem20 Chemical […]

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Products

  • Aerosol Particle Counters
  • Liquid Particle Counters for Chemical and Water Particle Monitoring Applications
  • Microbial Samplers
  • BioCapt®Certificates of Analysis
  • Compressed Gas Particle Counters
  • Molecular Monitors
  • Software / Data Management

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  • Photonics & Optics
  • Aerospace
  • Particle Measurement for Industrial Manufacturing

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About Us

  • Contact Particle Measuring Systems
  • Why Choose Particle Measuring Systems
  • Particle Measuring Systems’ Executive Team
  • Careers
  • Corporate Responsibility
  • COBE
  • Parent Company
  • Press Releases
  • ISO Registrations & Quality Policy
  • Trademarks & Patents
  • Anti-Slavery
  • Export Compliance

Particle Measuring Systems- USA

Corporate Headquarters
5475 Airport Blvd.
Boulder, CO 80301

T. +1 303-443-7100
F. +1 303-440-1090
E. [email protected]

Keep in touch! Receive industry news from us:

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