Lasair II 110 Particle Counter Wins Prestigious Best Product Award (Press Release)

Editors' Choice Best Product Award Presented to Particle Measuring Systems for Semiconductor Manufacturing Excellence

July 14, 2005

In developing a product that is truly making a difference in semiconductor manufacturing, Particle Measuring Systems received the prestigious Editors' Choice Best Product Award, presented annually by Semiconductor International magazine, for its Lasair II® 110. In a ceremony July 13 in San Francisco, Semiconductor International announced 20 winners whose products are making a difference in semiconductor manufacturing.

The Lasair II 110 is the first particle monitor to use a thermally-chilled, solid state diode laser to count 0.1 micron particles. It offers accuracy, reduced operating costs, and a three year laser warranty. The Lasair II stores 3,000 samples, providing unique data collection and recipe features that make cleanroom certification faster and easier. It is the only particle counter can be control from a desktop web-browser as it samples in the cleanroom, then downloads the data into Excel. Data can also be downloaded directly into Facility Net software for advanced analyses and reports.

"Continued advances in semiconductor technology have reshaped the world, and our Editors' Choice Best Product Awards program honors those products that have made those advances possible," said Pete Singer, Editor-in-Chief of Semiconductor International. "These products embody the very best of innovations on which chipmakers rely to make their products smaller, faster, cheaper and more reliable. We congratulate the people and the companies that have had the insight and fortitude to bring these innovative products to the market."

Semiconductor International, published by Reed Business Information and a part of Reed Elsevier's global array of information products, is the leading technical publication reaching and covering the global semiconductor manufacturing industry. SI boasts the industry's most experienced full-time technical editorial team, and has the largest circulation to semiconductor manufacturers of any industry publication. Additional information about SI and its many products and activities are available at www.semiconductor.net.

Particle Measuring Systems is the industry leader in microcontamination monitoring. Particle Measuring Systemscombines high-performance instrumentation with unrivaled application expertise to solve the problems of semiconductor, disk drive and pharmaceutical manufacturers, and general cleanroom applications.

LASAIR® is a registered trademark of Particle Measuring Systems, Inc.

For more information contact: Nina Akindele
Manager, Marketing and Communications
303-443-7100 ext 258.
nakindele@pmeasuring.com