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Next Class: August 13th and 14th, 2013
Particle Measuring Systems presents Particle College™, an educational seminar on the fundamentals of particle counting, microbial air sampling, molecular contamination, and their applications in controlled environments
Through presentations and demonstrations you will learn about particles (what they are and how they are detected), forces on particles, and which types of instruments are used to quantify contaminants in clean environments. Professionals with real-world experience will instruct you on the mechanics of detecting particulates, discuss the benefits and considerations of various monitoring techniques, and review regulatory requirements.
This presentation looks in depth at Mie, Rayleigh, and other theories of light scattering, discussing the origins of the equations and how they were derived. Additionally, we take a closer look at the influence of particle size, index of refraction, and shape on scattering intensity.
This presentation delves into the more difficult areas of liquid particle counting, including what happens to particle sizing when the index of refraction changes in the fluid, particle, or both. What constitutes statistical significance and is there anything that can improve the data quality? In the remaining time we will discuss the issues of importance to you. Bring your difficult liquid application questions and we will share our knowledge with you.
This is a detailed discussion covering instrument design and requirements, specifications, and calibration. You’ll learn about coincidence loss, maximum particle concentration, and effects of an instrument’s resolution on particle measurement. Industry terminology is provided.
This presentation details the different types of liquid particle counting systems and discusses the pros and cons of each. Methods of performance verification are presented and data is used to help provide a better understanding of calibration accuracy in these high performance products.
This session presents and discusses EU and FDA GMP requirements for cleanroom and process monitoring for microbiological contamination. It includes further introductory discussions on different techniques and technologies that are applied across regulated industries to monitor for microbial contaminants with a particular focus on active air sampling devices.
This presentation is an overview about molecular contamination, its sources, its effects, and how it interacts with materials. The objective of this session is to provide an understanding of common molecular contamination problems and how these problems can be resolved.
This course introduces the types of particle counters used to monitor aerosol particles. The equipment includes particle counters, spectrometers, monitors, and sensors. A comparison between mobile, fixed, and sequential monitoring along with the advantages and disadvantages of each method are covered. Additionally, specialized applications and possible types of devices to monitor those applications are discussed.
This is a discussion of nanoparticle sources and impacts, technologies for measuring nanoparticles, and behavior of nanoparticles in clean environments. Technologies including condensation particle counters, electrometers, and scanning mobility particle sizers will be discussed.
This session is a technical aid to understanding the importance of correct particle counter calibration. The key elements of the ISO-21501 calibration standard are explained.
Topics include: Understanding system reports, interpreting data and trend analysis, setting alarm limits, and improving process control.
Particle behavior is presented by reviewing the transport characteristics of particles, interactions between particles, and various forces on particles. Filtration mechanisms and filter efficiency curves are introduced for air and liquid systems. The roles of index of refraction, particle size and particle shape are reviewed. In addition, the principles of Rayleigh and Mie light scattering are covered, including basic scattering relationships.
Cleanroom basics are introduced, including a review and comparison of ISO and FS 209E classifications. Particle size, composition, types, and sources are reviewed in a detailed look at particle basics. Also discussed are commonly used measurements to define the size of irregular shaped particles and the implications of each technique. Additionally, particle concentrations in liquid and air samples are explored.
USP, EP and JP requirements define the limits and test requirements for pharmaceutical injectable liquids. The session looks at those requirements and how the original limits were defined. It also reviews USP guidance and suitable acceptance criteria for equipment used in liquid particle testing.
Different aerosol particle sampling methods utilize a length of tubing to transport the sample to the particle counter. Learn how tubing affects particle counts and different causes of particle transport losses. A demonstration in the course will allow attendees to witness the effect of particle transport losses over a short tubing length.
This is an overview of GMP regulations for Environmental Monitoring, with a focus on aseptic processing and the differences between cleanroom classification and monitoring. FDA and EU GMP requirements are contrasted throughout the discussion. Includes requirements for particle (nonviable) and microbial (viable) monitoring in cleanroom air and compressed gas.
This is a basic overview of implementing a particle and microbial monitoring system in life sciences applications, focusing on meeting GMP requirements. Topics include an overview of the requirements and risk assessments, installation locations and mounting options, and GAMP.
This presentation discusses the functional advantages of NanoVision Technology over traditional analog type measurement approaches. Advanced topics and concepts are covered including cosmic noise exclusion, near-volumetric performance, 40 nm particle detection, and particle measurement in high molecular scatter fluids.
The methods and techniques for part cleanliness testing of common parts used within the semiconductor, disc drive, automotive, and pharmaceutical/medical device industries are described. Topics include methods of particle extraction, techniques for measuring particles, data analysis, and optimizing parameters of ultrasonic extraction.
A discussion of the differences between Certification vs Monitoring of cleanrooms and how the particle counter used for certification impacts the certification process. Review of ISO 14644-1 and 2 and what is required to perform a clean room certification. An overview of the various Particle Measuring System products which can be used for cleanroom certification.
Examine clean room monitoring systems with an emphasis on the software utilized to collect and analyze the particulate data. Review how the data is transmitted and collected from the instruments and how data can be used for process analysis. Analyze historical particulate data to see how the software can convert data into information.
This session will focus on using statistics to determine the sizing accuracy and counting efficiency of a liquid particle counter. The technique for calculating these statistics will be reviewed, and we will utilize the Sizing Accuracy calculation spreadsheet that we have developed.
This demonstration will show and discuss the technologies available from Particle Measuring Systems for sampling of airborne biological contamination. Available technologies include sieve impactors, slit-to-agar samplers, real-time microbial detection equipment, and the associated accessories for each of these technologies.
An in-depth discussion of how molecular contamination is monitored. Analytical techniques and monitoring strategies will be presented. The objective of this session is to provide the information necessary to establish a cleanroom molecular contamination monitoring program.
Learn more about the different liquid sampling options and how to choose which sampler is best for your application.
Registration includes classroom materials (including a binder with all course presentations/handouts) as well as breakfast and lunch both days and a dinner on Tuesday evening hosted by Particle Measuring Systems for all our guests.
CEUs are awarded for this class upon request
Question: What time does the class start/end so that I can book flights?
Answer: Registration starts at 7:15 am and the class starts at 8:00 am on the first day, and runs until 5:00 pm on the second day. There are certain classes everyone should attend and there are industry-specific courses attendees can select from.
The cost of on-site training depends on the scope of the seminar. Contact
firstname.lastname@example.org or your local sales representative for more information.