February 15, 2016 04:22:16 PM

Particle Measuring Systems at SEMICON Korea 2016

Written by Nina Morton

Particle Measuring Systems at SEMICON Korea 2016

Carrying on a global Semicon tradition, Particle Measuring Systems (PMS) had a notable booth presence at Semicon Korea in January. The overall theme of the booth was “Global experts in contamination monitoring solutions since 1972.” PMS had over 220 visitors from a large variety of semiconductor companies. Most of the booth visitors were from Korea, but there were also visitors from China, Taiwan, Japan, Malaysia, America, and Europe.

This show also saw a return to Particle Measuring Systems’ long standing tagline, “Without measurement there is no control.” PMS featured the Nano-ID® NPC10 to help customers get actionable data fast, the Ultra DI 20 liquid particle counter to help customers get useful data to solve problems, the UltraChem 40 liquid particle counter for flexible monitoring of chemicals, and the AirSentry II AMC detection system for simple molecular monitoring.

PMS will be at all the major Semicon shows in 2016 including China, West, Taiwan, Europa, and Japan.