May 10, 2016 05:40:34 PM

Particle Measuring Systems Continues Environmentally Friendly Approach

Written by Global Administrator

Global company expands environmental commitment with multiple programs at Boulder Headquarters.

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April 13, 2016 01:22:35 AM

Gilberto Dalmaso 博士出席CLEAN ROOM 2016

Written by Nina Morton

Dr. Gilberto Dalmaso to present at CLEAN ROOM 2016

Gilberto Dalmaso博士, 是PMS的全球无菌制程开发经理,将出席CLEAN ROOM2016米兰的会议。他在会议上的发言“针对A级关键区域空气与表面监测的要求和新的解决方案”,重点在于可以改善并优化洁净室微生物污染的空气与表面监测的新技术。

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April 13, 2016 01:21:53 AM

更快速,更简单的表面微生物污染监测解决方案

Written by Nina Morton

Faster, Simpler Surface Testing Solution for Biological Contamination

Particle Measuring Systems Releases the SurCapt™ Microbial Surface Detection Kit.

February 15, 2016, Boulder, CO - The newly released SurCapt™ Microbial Surface Detection Kit from Particle Measuring Systems (PMS) is an all-inclusive, ready-to-use solution which simplifies and quickens the process of environmental surface testing for biological contamination. The kit uses GreenLight® Technology for the rapid detection of microbial activity on cleanroom surfaces and the design reduces the likelihood of sample cross-contamination and mishandling by the operator.

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March 15, 2016 12:28:31 PM

了解鉴定哪里是样本采集点

Written by Nina Morton

Sample-Points-Pharma

随着环境系统设计中,无论是在制药洁净室或清洁装置(RABS,隔离器等)进行,我们经常问应该在什么地方采样点粒子监控。

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February 29, 2016 10:16:45 AM

PMS赞助PDA课题

Written by Corrin Salamatian

Particle Measuring Systems Sponsors PDA Course   Particle Measuring Systems Sponsors PDA Course

多年来PMS都是注射药物协会(PDA)的支持者。最近我们赞助在马里兰州PDA总部研究所进行的PDA关于环境监测的培训,这个研究课题涵盖了广泛科学领域体现了PDA的核心竞争力,包括无菌处理,生物技术,环境监测,过滤,微生物学,质量/监管事务,验证;以及专门领域,如冷链,冻干,预填充注射器和目视检查。一年四季PMS在PDA的项目中都有参加。在2月23日,高级科学家Claudio Denoya博士在柏林的PDA欧洲会议上发表了关于制药微生物课题的讲话。他的演讲涵盖了微生物的发现,举例说明,在药物产品中发现的微生物污染物的鉴定和制造的环境。全球无菌处理发展专家Denoya博士和Denoya博士,在10月份的PDA东南分部实验室会议的海报上可以看到。

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February 24, 2016 10:20:02 AM

超纯水的粒子计数解决方案的比较

Written by Nina Morton

A Comparison of Particle Counting Solutions for UPW

通过不断处理和先进的设备,半导体制造商往接近14纳米的特征尺寸和航向更小方向努力,然而硬盘驱动器浮动高度现在小于10纳米。这个不断减少器件特征尺寸需要比较超纯水(UPW)的清洁级的改进。 UPW纯度是在最多生产步骤高度直接使用晶片作为最终的清洁剂和漂洗剂显得尤其重要。利用激光光学和探测器技术,超纯水粒子浓度≥20纳米(≥9纳米金属颗粒)最新进展可以有效地监控。

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February 15, 2016 04:22:16 PM

Particle Measuring Systems at SEMICON Korea 2016

Written by Nina Morton

Particle Measuring Systems at SEMICON Korea 2016

Carrying on a global Semicon tradition, Particle Measuring Systems (PMS) had a notable booth presence at Semicon Korea in January. The overall theme of the booth was “Global experts in contamination monitoring solutions since 1972.” PMS had over 220 visitors from a large variety of semiconductor companies. Most of the booth visitors were from Korea, but there were also visitors from China, Taiwan, Japan, Malaysia, America, and Europe.

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February 11, 2016 11:45:42 AM

Are your particle counters ISO 14644-1 compliant?

Written by Nina Morton

Are your particle counters ISO 14644-1 compliant?

Are your particle counters ISO 14644-1 compliant and able to be calibrated to all required tests according to ISO 21504-4?

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February 4, 2016 09:55:06 AM

新闻: ISO 14644 修订总结

Written by Corrin Salamatian

New paper: ISO 14644 Revisions Summary

最近修订了ISO 14644-1 和2介绍了关于洁净室分类和检测指南方面的改变。本文的亮点在新的ISO 14644-1版本的改变和以前版本的比较,以及制药欧盟GMP附录1和FDA无菌处理准则可能产生的影响。

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