Are you unsure how to choose a microcontamination monitor? Or, do you own a particle counter, but are not confident that it is providing you with reliable data that allows you to correctly interpret the results? Read on for the most up-to-date monitoring information and products.
TOPICS
TECHNICAL PAPERS
Our online library of papers written by our in-house experts is extremely popular because it is a quick way for you to learn about particle counting and is available 24x7. Be sure to review it to find support for your application. Our newest papers are:
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Technical Review: European GMP Annex 1 – 2008
Read a technical summary of the updated particle monitoring recommendations in the 2008 EU GMP Annex 1. This paper discusses why the new Annex was needed, and how to comply. Continue to learn more... |
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Particle Monitoring in Ultra Pure Water for Microelectronic Applications
This presentation discusses why particle monitoring is critical, how to choose a particle counter, and how to interpret the data provided by the particle counter. Learn more ....
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Basic Guide to Particle Counting: Recently Updated!
We have recently updated this overview of particle contamination. It starts by discussing sources of contamination and monitoring technologies available and continues by discussing various... Download this very popular paper today! |
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In AMC Monitoring, Simple Designs Go a Long Way
Over the past several years, different sensor and detection technologies have been adapting themselves by increasing their complexity in order to meet the requirements needed for effective Airborne Molecular Contamination (AMC) monitoring. Complex designs only add to the uncertainty in the measurement by introducing opportunity for the sample to be altered prior to detection, or by creating potential hardware failure points which require regular preventative maintenance. For AMC monitoring equipment, the principle of Occam’s razor appears to ring true – "All other things being equal, the simplest solution is best." Continue to learn more... |
WEBCAST: ITRS ROADMAP
PRODUCT INFORMATION
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New Portable Particle Counter: LASAIR III
Particle Measuring Systems has recently released a new portable particle counter. The Lasair III particle counter sets the new standard for portable aerosol particle counters. The on-board Pulse Height Analyzer (PHA) ensures ISO 21501 compliance. The large IR touch-screen controls and intuitive user interface make the system very easy to use. The particle counter's rugged enclosure is chemically resistant and lightweight for portability. The enclosure also has a streamlined design that minimizes particle traps and makes the system easy to clean.Continue to learn more now..
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New Tabletop Parts Cleanliness Testing Station
The Surfex 100M tabletop monitor is a compact, integrated particle extraction system for monitoring and qualifying part cleanliness. By combining ultrasonic extraction, particle measurement, and high purity fluidics, the Surfex 100M increases testing throughput up to ten-fold over traditional methods, saving time and money. The system is specifically designed to ... Learn more ...
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PARTICLE COLLEGE 2008
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We will be holding two Particle College classes in Boulder, CO on June 3-4, 2008. Plan now to attend this popular class next year. Get more details, or register on our website.
Available Classes*
- Particle Physics
- Particle Mechanisms
- Fundamentals of Particle Counters
- Introduction to Monitoring Particles in Air
- Advanced Air Monitoring
- Introduction to Molecular Contamination
- Advanced Molecular Contamination
- Introduction to Liquid Particle Counting
- Advanced Liquid Particle Counting
- Parts Cleanliness Testing
- Pharmaceutical Environmental Monitoring
- GAMP and USP Regulatory Requirements
- Monitoring Pharmaceutical Liquids
Available Demonstration Stations
- Facility Monitoring Systems (FMS)
- Cleanroom Certification and Products
- Monitoring Particles in Injectables
- AMC Monitoring and Calibration
- CLS 700 Liquid Sampler and SamplerSight Software
- Calculating Statistical Data in Liquid Particle Counting
- Minienvironment Monitoring
- Calibration of Particle Counters
*Classes and demonstrations will be held simultaneously - you choose which to attend. The agenda will be available at the start of the class. Each class and demo will be offered several times throughout the two days in an effort to accommodate all schedules and interests.
Visit our website to register or to find more information. Sign up by May 2nd for an Early Bird discount.
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SYSTEM SUPPORT
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What do you do when you don't know what to do? Call Particle Measuring Systems!
We have three levels of System Support packages to meet the requirements of our diversified customer base. Our System Support staff is ready to answer your questions regarding our Facility Monitoring Software and the instruments that can connect to it, as well as questions regarding our batch sampling software. Don't waste your valuable time trying to find solutions when our experts can quickly assist you. If you would like details regarding the different plans and how to join, please contact our Inside Sales Group at 303.443.7100.
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SERVICE SCHEDULING TO REDUCE TURNAROUND TIME
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To keep your instrument working on your site longer, we now provide service and calibration scheduling. This allows you to use your instrument up to a pre-arranged date prior to sending it in for service. Turnaround times for annual calibrations can be reduced to one week when service work is scheduled at least three weeks in advance.
Call Customer Service at (800) 557-6363 to schedule your service work.
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FREQUENTLY ASKED QUESTIONS
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Our experts are available to answer your questions. Submit your question and our experts will respond directly to you. You can also read our library of FAQs to help with your application.
Recent question: What are some typical particle distributions?
Read the answer on our website.
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Contact me if you have any questions or would like a quote or support on any product.
Ann Carwell
Particle Measuring Systems
(847) 340-4200
acarwell@pmeasuring.com
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Particle Measuring Systems is the global leader in microcontamination monitoring, with 35 years experience developing and manufacturing particle counters.
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